Quality of pre-series production sensors (148 delivered)

Short Writeup

• Temperature during measurements ,(with raw data)
• Leakage current at Vb=150V , temperature corrected (20degC),(with raw data)
• Leakage current at Vb=350V, temperature corrected (20degC),(with raw data)
• Wafer thickness ,(with raw data)
• Full depletion voltage ,(with raw data)
• Relation between wafer number and full depletion
• Maximum bias resistance in a sensor ,(with raw data)
• Minimum bias resistance in a sensor ,(with raw data)
• Number of defect strips ,(with raw data)
  • Number of Oxide-punchthrough ,(with raw data)
  • Number of Pinholes ,(with raw data)
  • Number of short Al electrodes ,(with raw data)
  • Number of open Al electrodes ,(with raw data)
• Leakage current stability for 24h
  • no temperature correction
  • corrected for temperature to 20degC
  • plot to detail the initial variations
  • Histogram of maximum increase
• I-V curves
  • Delivery #1
  • ditto,temperature corrected (20 degC)
  • Delivery #2
  • ditto,temperature corrected (20 degC)
  • Delivery #3
  • ditto,temperature corrected (20 degC)
    • ditto,temperature corrected batch A
    • ditto,temperature corrected batch B
    • ditto,temperature corrected batch C
    • ditto,temperature corrected batch D
    • ditto,temperature corrected baby