Quality of pre-series production sensors (256 delivered)

• Temperature during measurements
• Leakage current at Vb=150V , temperature corrected (20degC)
• Leakage current at Vb=350V, temperature corrected (20degC)
• Wafer thickness
• Full depletion voltage
• Maximum bias resistance in a sensor
• Minimum bias resistance in a sensor
• Number of defect strips
  • Number of Pinholes
  • Number of short Al electrodes
  • Number of open Al electrodes
• Leakage current stability for 24h, corrected for the temperature
  • Stability for 24 hr
  • plot to detail the initial variations
  • Histogram of maximum increase (excluding the first data points)
• I-V curves (temperature corrected)
  • Delivery #1
  • Delivery #2
  • Delivery #3
    • ditto, batch A
    • ditto, batch B
    • ditto, batch C
    • ditto, batch D
    • ditto, baby
  • Delivery #4
    • ditto, batch A
    • ditto, batch B
    • ditto, batch C
    • ditto, batch D
  
  
• C-V curves
  • Delivery #1, #2
  • Delivery #3
  • Delivery #4